Title: Comparison of Structural properties between silicon and porous silicon substrate of boron and aluminum co-doped zinc oxide nanostructure films
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Title: |
Comparison of Structural properties between
silicon and porous silicon substrate of boron and aluminum co-doped zinc oxide nanostructure films
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Author Name: |
Rashid Hashim Jabbar, Anwar Hussein Ali |
Abstract: |
This paper presents the comparison of structural properties between
silicon and porous silicon(PS) structural substrates used in the same
conditions to deposition of aluminum boron co-doped ZnO (AZB) thin
films of nanostructures with doping (2,4,6,8 at %.)Deposited at 450 oC on
silicon and porous silicon substrates by chemical spray pyrolysis in
(150±5 nm) thickness. The structure of AZB nanostructure films has been
found to exhibit the hexagonal wurtzite structure. The surface topography
of the films and the porous silicon was studied by using the Scanning
Electron Microscopy (SEM), Transmission electron microscopy (TEM)
and the Atomic Force Microscopy (AFM), the surface concentration
shows that the roughness of the thin films increase with the increase of
doping concentrations. The structural details and microstructure were
obtained from X-ray diffraction, the results shows the grain size
decreased with the increase of doping concentration. |
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